Publications
Featuring: Moku:Lab, Spectrum Analyzer
Source: Science Advances (Oct 2023)
Authors: Yifan Zhu, Xiaowei Ge, Hongli Ni, Jiaze Yin, Haonan Lin, Le Wang, Yuying Tan, Chinmayee V. Prabhu Dessai, Yueming Li, Xinyan Teng, Ji-Xin Cheng
Featuring: Moku:Lab, PID Controller
Source: IEEE Photonics Journal (Oct 2023)
Authors: Albert van Rees, Lisa V. Winkler, Pierre Brochard, Dimitri Geskus, Peter J. M. van der Slot, Christian Nolleke , and Klaus-J. Boller
Featuring: Moku:Pro, Phasemeter, PID Controller
Source: Physical Review Applied (Aug 2023)
Authors: Victor Huarcaya, Miguel Dovale Álvarez, Daniel Penkert, Stefano Gozzo, Pablo Martínez Cano, Kohei Yamamoto, Juan José Esteban Delgado, Moritz Mehmet, Karsten Danzmann, and Gerhard Heinzel
Featuring: Moku:Lab, Frequency Response Analyzer
Source: Chinese Journal of Lasers (May 2023)
Authors: Liu Xian, Zhai Zehui, Liu Jianli, Han Xufei
Featuring: Moku:Lab, Phasemeter
Source: Optics Express (Apr 2023)
Authors: Benjamin P. Dix-Matthews, David R. Gozzard, Shane M. Walsh, Ayden S. McCann, Skevos F. E. Karpathakis, Alex M. Frost, Charles T. Gravestock, and Sascha W. Schediwy
Featuring: Moku:Lab, Laser Lock Box
Source: Optics Express (Apr 2023)
Authors: Zifan Zhou, Ruoxi Zhu, Yael Sternfeld, Jacob Scheuer, Jason Bonacum, and Selim M. Shahriar
Featuring: Moku:Lab, Frequency Response Analyzer, Spectrum Analyzer
Source: Nanoscale (Mar 2023)
Authors: Gabriele Baglioni, Roberto Pezone, Sten Vollebregt, Katarina Cvetanović Zobenica, Marko Spasenović, Dejan Todorović, Hanqing Liu, Gerard J. Verbiest, Herre S. J. van der Zant, and Peter G. Steeneken
Featuring: Moku:Lab, Phasemeter
Source: AIP Advances (Mar 2023)
Authors: Hao-Jie Li; Hong-Xing Qi; Ming-Zhong Pan; Xin-Dong Liang; Jian-Jun Jia; Guo-Dong Liu; Jian-Yu Wang
Featuring: Moku:Lab, Data Logger
Source: Scientific Reports (Mar 2023)
Authors: Daphne M. P. Naessens, Judith de Vos, Edo Richard, Micha M. M. Wilhelmus, Cornelis A. M. Jongenelen, Edwin R. Scholl, Nicole N. van der Wel, Johannes A. Heijst, Charlotte E. Teunissen, Gustav J. Strijkers, Bram F. Coolen, Ed VanBavel & Erik N. T. P. Bakker