Flexible equipment for the next generation of
test and measurement.

Moku Labs

Measure more with less

Moku:Lab is a reconfigurable hardware platform that combines the digital signal processing power of an FPGA with versatile analog inputs and outputs. This simplifies your workflow by giving you access to 12 high-performance instruments that enable you to measure what you need when you need.

Configure your Moku:Lab

Dual DC to 200 MHz, 500 MSa/s
Dual DC to 300 MHz, 1 GSa/s
50 Ω / 1 MΩ
Input coupling
Input voltage noise
Better than 30 nV/√Hz above 100 kHz
Timebase accuracy
Better than 500 ppb

Moku:Lab Documentation


Getting Started


User Manuals

App Notes


Versatile analog front-end.

Moku:Lab’s analog front-end is designed for maximum versatility. Its two 500 MSa/s inputs can be configured for AC or DC coupling, 50 Ω or 1 MΩ impedance and an input voltage range of 1 Vpp or 10 Vpp. Moku:Lab also features two 1 GSa/s outputs with 300 MHz anti-aliasing filters, allowing you to generate two high-precision waveforms while measuring on its inputs.


Precision timing

Moku:Lab features an ultra-stable internal oscillator with better than 500 ppb accuracy, as well as 10 MHz input and output references for synchronization with external timebases.


External trigger

Moku:Lab features a dedicated DC to 5 MHz external trigger input designed for TTL (1.8 to 5 Volts) voltages. Some instruments use Moku:Lab’s analog inputs as high-precision external triggers, giving you more control over your system’s trigger settings.

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Freedom in the lab.

With Moku:Lab, you’re not tethered to your equipment. Control your experiment wirelessly and move freely throughout the lab with your measurements at your side.



Connect Moku:Lab to an existing WiFi network or configure it to create its own wireless network.



Connect to a wired network via Moku:Lab’s 100 Mbps Ethernet port. Great option in environments with WiFi congestion.



Allows you to fully control your Moku:Lab via iPad even in WiFi-restricted environments.

Moku:Lab Technical Specifications

Analog I/O

Analog inputs

  • Channels 2
  • Bandwidth (-3 dB) 200 MHz into 50 Ω
  • Sampling rate 500 MS/s per channel
  • Resolution 12-bit
  • Maximum voltage range 10 Vpp into 50 Ω with 20 dB attenuation
  • Input impedance 50 Ω / 1 MΩ
  • Input coupling AC / DC
  • AC coupling corner (-3 dB) 100 Hz into 50 Ω / 30 Hz into 1 M Ω
  • SNR 60 dBFS (per sample)
  • Input referred noise 30 nV/√Hz above 100 kHz
  • Connector BNC

Analog outputs

  • Channels 2
  • Bandwidth (-3 dB) >300 MHz
  • Sampling rate 1 GSa/s per channel
  • Resolution 16-bit
  • Voltage range 2 Vpp into 50 Ω
  • Output impedance 50 Ω
  • Output coupling DC
  • Connector BNC

External trigger input

External trigger

  • Trigger waveform TTL compatible
  • Trigger bandwidth DC to 5 MHz
  • Trigger impedance Hi-Z
  • Min trigger level 1.8 V
  • Max trigger level 5 V
  • Connector BNC

Clock reference

On-board clock

  • Frequency 10 MHz
  • Stability < 500 ppb

10 MHz reference input

  • Expected waveforms Sine / square
  • Frequency 10 MHz ± 250 kHz
  • Input range -10 dBm to +10 dBm
  • Connector BNC

10 MHz reference output

  • Waveform type Square
  • Output frequency 10 MHz
  • Output level -3 dBm
  • Connector BNC

Moku:Lab Noise Specifications

Input voltage noise

“Input voltage noise” describes the noise floor of the analog inputs and is represented as an amplitude spectral density (magnitude of input voltage noise at different frequencies normalized to a 1 Hz bandwidth). It is impossible to resolve signal features below the noise floor. Input voltage noise is a key specification for lock-in amplifiers as it can limit signal-to-noise ratio (SNR) in weak-signal applications.


ADC noise-free code resolution

Referring to the number of bits of resolution beyond which it is no longer possible to resolve individual codes, this spec is measured for 3 µs at 500 MSa/s with 50 Ω terminated inputs and calculated based on peak-to-peak ‘code noise’ at the output of the ADC with terminated inputs.

  • Units: Least Significant Bits (LSBs)
  • Noise-free code resolution = log2 (2N / [ 6.6 x σ ]) where σ is the RMS error (standard deviation) of the code noise distribution and 2N is the full range of the ADC

ADC cross-talk

ADC cross-talk refers to interference from one ADC to the other, and is measured from 120 MHz down to 1 MHz where radio-frequency (RF) cross-talk is most severe. Cross-talk is caused by the coupling of electromagnetic radiation from one conducting element (wire) to another. The wires in electronic circuits act as antennas.

ADC crosstalk