April 15, 2024 10:12 pm
Published by jball
The latest release brings a new instrument to Moku devices, along with enhancements like cross-correlation measurements, the ability to control... View Article
April 15, 2024 7:59 pm
Published by jball
Cross-correlation is a useful signal-processing method for obtaining electronic measurements. This versatile analytical technique eliminates uncorrelated, or random, noise from... View Article
January 24, 2024 10:56 pm
Published by jball
Almost everyone who has a passing interest in physics has heard of the Heisenberg uncertainty principle. In its most famous... View Article
January 17, 2024 7:20 pm
Published by jpatterson
Everywhere you look, it’s obvious: Devices today are getting smaller. What you may not realize is how small they’re truly... View Article
December 19, 2023 6:41 pm
Published by mmcardle
Device characterization and validation often require more than one instrument to fully qualify your design. You may need an oscilloscope,... View Article
October 6, 2023 11:27 pm
Published by mmcardle
Introduction In the ever-evolving landscape of device test and validation, engineers continually seek innovative ways to enhance efficiency, reduce costs,... View Article
October 1, 2023 1:13 am
Published by jball
Featuring: Moku:Lab, Spectrum Analyzer Source: Science Advances (Oct 2023) Authors: Yifan Zhu, Xiaowei Ge, Hongli Ni, Jiaze Yin, Haonan Lin, Le... View Article